Hitachi SEM
Manufacturer: Hitachi
This Hitachi S-4500 field emission scanning electron microscope (FESEM) is capable of producing high-resolution images between 20k and 500k. The system is capable of accelerating voltages between 0.5-30 kV. With precision setup of the aperture and beam, it is capable of capturing images with resolution of ~5 nm. The system can accommodate samples up to 2" in diameter on its manual three-dimension sample stage, with tilt capability from 0° to 45°.
Operating Instructions
Allowed Materials
Samples to be imaged must be dry, and stable in vacuum and under electron irradiation. The maximum sample size is approximately 2 inches in diameter. If the sample is non-conducting, it might be necessary to coat the sample with a thin conductive layer before imaging. Only approved materials (available in the lab) will be used for mounting samples; copper hold-down clips, carbon-impregnated sticky dots, and colloidal graphite are available.
Prohibited Materials
Substances that can outgas/sublime/evaporate in vacuum; hydrocarbons (oil, grease, fingerprints); living or recently deceased beings or tissues of the same; liquids of any kind; materials with high vapor pressures.